Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments

摘要

The need to understand and reject backgrounds in Ge-diode detectordouble-beta decay experiments has given rise to the development of pulse shapeanalysis in such detectors to discern single-site energy deposits frommultiple-site deposits. Here, we extend this analysis to segmented Ge detectorsto study the effectiveness of combining segmentation with pulse shape analysisto identify the multiplicity of the energy deposits.